Lovics, R., Csik, A., Takáts, V., Hakl, J., Vad, K.: Structural modification of boron-doped ZnO layers caused by hydrogen outgassing.
Nucl. Instrum. Methods Phys. Res. Sect. B-Beam Interact. Mater. Atoms. 354 305-307, 2015.

Lovics, R., Csik, A., Takáts, V., Hakl, J., Vad, K.: Structural modification of boron-doped ZnO layers caused by hydrogen outgassing.
International Conference on Smart Functional Materials for Shaping our Future. Debrecen, Hungary, 19-20 Sept., 2014 : abstract book 134, 2014.

Lovics, R., Csik, A., Takáts, V., Hakl, J., Vad, K.: Structural modification of boron-doped ZnO layers caused by hydrogen outgassing.
26th International Conference on Atomic Collisions in Solids. ICACS 26. Debrecen, Hungary, 13-18 July, 2014 [1], 2014.

Lovics, R., Csik, A., Takáts, V., Hakl, J., Vad, K.: Thermal assisted motion of oxygen and hydrogen in zinc oxide layer.
16th International Conference on Thin Films : abstract book 256, 2014.

Lovics, R., Csik, A., Takáts, V., Hakl, J., Vad, K., Langer, G.: Depth profile analysis of solar cells by Secondary Neutral Mass Spectrometry using conducting mesh.
Vacuum. 86 (6), 721-723, 2012.

Lovics, R., Csik, A., Takáts, V., Langer, G., Vad, K.: Study of Atomic Migration in Zinc Oxide Layers by Depth Profile Analysis.
In: 27th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC, München, 2530-2531, 2012. ISBN: 3936338280

Lovics, R., Takáts, V., Csik, A., Hakl, J., Langer, G., Baji, Z., Lábadi, Z., Vad, K.: Surface roughness and interface study by Secondary Neutral Mass Spectrometry.
14th Joint Vacuum Conference, 12th Europena Vacuum Conference, 11th Annual Meeting of the German Vacuum Society, 19th Croatian-Slovenian Vacuum Meeting. Dubrovnik, Croatia, 4-8 June, 2012 : abstract book 211, 2012.

Lovics, R., Csik, A., Takáts, V., Vad, K., Langer, G.: Átlátszó vezető oxidrétegek tulajdonságainak vizsgálata.
In: "Új fények a fizikában" : Fizikus vándorgyűlés Pécs, 2010. augusztus 24-27.. Szerk.: Ádám Péter Mechler Mátyás Illés, Eötvös Loránd Fizikai Társulat, Budapest, 45, 2010.

Lovics, R.: Depth profile analysis of amorphous/microcrystalline SiLICIUM solar cells and Aluminum doped ZinC oxide by secondary neutral mass spectroscopy.
Acta Phys. Debr. 44 69-77, 2010.

Lovics, R., Takáts, V., Csik, A., Langer, G., Vad, K.: Depth Profile Analysis of Amorphous/Microcrystalline Si Solar Cells by Secondary Neutral Mass Spectroscopy.
In: 5th World Conference on Photovoltaic Energy Conversion, 6-10 September 2010, Valencia, Spain, WIP-Renewable Energies, Munich, 3152-3153, 2010. ISBN: 3936338264

Lovics, R., Takáts, V., Csik, A., Langer, G., Vad, K.: Depth Profile Analysis of Amorphous/Microcrystalline Si Solar Cells by Secondary Neutral Mass Spectroscopy.
25th European Photovoltaic Solar Energy Conference and Exhibition, 5th World Conference on Photovoltaic Energy Conversion, Valencia, Spain : annual report 25, 2010.

Lovics, R., Csik, A., Takáts, V., Vad, K., Langer, G.: SNMS depth profile analysis of solar cells using conducting mesh.
13th Joint Vacuum Conference June 20-24, 2010, Štrbské Pleso 15, 2010.