Csiszár, G., Erdélyi, G., Langer, G., Erdélyi, Z.: Atomic transport in amorphous Mo-Cu and Ta-Cu immiscible systems.
J. Alloy. Compd. 951 1-11, 2023.

Kovács, R., Langer, G., Gyöngyösi, S., Erdélyi, Z.: A versatile technique for in situ investigation of the effect of thin film cracking on gas permeation of coated flexible polymers.
Rev. Sci. Instrum. 92 (1), 1-4, 2021.

Kovács, R., Gyöngyösi, S., Langer, G., Baradács, E., Daróczi, L., Barkóczy, P., Erdélyi, Z.: Effect of nanoscopic defects on barrier performance of thin films deposited by plasma-enhanced atomic layer deposition on flexible polymers.
Thin Solid Films. 738 1-13, 2021.

Kovács, R., Gyöngyösi, S., Langer, G., Baradács, E., Daróczi, L., Barkóczy, P., Erdélyi, Z.: Effect of nanoscopic defects on barrier performance of thin films deposited by plasma-enhanced atomic layer deposition on flexible polymers.
In: Abstract book for the 11th International Conference on Diffusion in Materials DIMAT-2021, Debreceni Egyetem Természettudományi Kar, Debrecen, 10-11, 2021.

Gurbán, S., Sulyok, A., Menyhárd, M., Baradács, E., Parditka, B., Cserháti, C., Langer, G., Erdélyi, Z.: Interface induced diffusion.
Sci. Rep. 11 (1), 1-11, 2021.

Kruhlov, I., Vladymyrskyi, I., Dubikovskyi, O., Sidorenko, S., Ebisu, T., Kato, K., Sakata, O., Ishikawa, T., Iguchi, Y., Langer, G., Erdélyi, Z., Voloshko, S.: Oxidation and reduction processes in Ni/Cu/Cr/Si(100) thin films under low-energy ion irradiation.
Mater. Res. Express. 6 (12), 126431, 2020.

Kovács, R., Gyöngyösi, S., Langer, G., Erdélyi, Z.: Al2O3 vékonyréteg mechanikai stabilitásának hatása az áteresztési tulajdonságokra.
In: Magyar Fizikus Vándorgyűlés 2019 Sopron, Eötvös Loránd Fizikai Társulat, Sopron], 117-117, 2019.

Langer, G., Erdélyi, G., Erdélyi, Z., Csiszár, G.: Determination of diffusion coefficients in immiscible systems: Cu-W as an example.
Materialia. 6 1-7, 2019.

Gyöngyösi, S., Kovács, R., Langer, G., Daróczi, L., Szatmáriné Bakonyi, E., Erdélyi, Z.: Fémoxid vékonyrétegek és restaurátori gyakorlatban alkalmazott mugyanták áteresztésvizsgálata.
In: Magyar Fizikus Vándorgyűlés 2019 Sopron, Eötvös Loránd Fizikai Társulat, Sopron, 23, 2019.

Gurbán, S., Petrik, P., Serényi, M., Sulyok, A., Menyhárd, M., Baradács, E., Parditka, B., Cserháti, C., Langer, G., Erdélyi, Z.: Electron irradiation induced amorphous SiO2 formation at metal oxide/Si interface at room temperature; electron beam writing on interfaces.
Sci. Rep. 8 (1), 1-7, 2018.

Iguchi, Y., Katona, G., Cserháti, C., Langer, G., Erdélyi, Z.: On the miscibility gap of Cu-Ni system.
Acta Mater. 148 49-54, 2018.

Parditka, B., Zaka, H., Erdélyi, G., Langer, G., Ibrahim, M., Schmitz, G., Balogh-Michels, Z., Erdélyi, Z.: The transition from linear to-parabolic growth of Cu3Si phase in Cu/a-Si system.
Scr. Mater. 149 36-39, 2018.

Cserháti, C., Langer, G., Parditka, B., Csik, A., Iguchi, Y., Czigány, Z., Erdélyi, Z.: Kirkendall Effect on the Nanoscale.
Diffusion Fundamentals. 30 1-11, 2017.

Molnár, G., Shenouda, S., Katona, G., Langer, G., Beke, D.: Determination of the compositions of the DIGM zone in nanocrystalline Ag/Au and Ag/Pd thin films by secondary neutral mass spectrometry.
Beilstein J. Nanotechnol. 7 474-483, 2016.

Zaka, H., Shenouda, S., Fouad, S., Medhat, M., Katona, G., Csik, A., Langer, G., Beke, D.: Formation of Cu6Sn5 phase by cold homogenization in nanocrystalline Cu-Sn bilayers at room temperature.
Microelectron. Reliab. 56 85-92, 2016.

Mohareb, N., Shenouda, S., Fadel, M., Talaat, H., Katona, G., Langer, G., Csik, A., Beke, D.: Investigation of solid-state reaction in Ag/Sn nanostructured thin films at room temperature.
Philos. Mag. 95 (27), 2990-3001, 2015.

Shenouda, S., Molnár, G., Langer, G., Katona, G., Kristály, F., Beke, D.: Kinetics of shift of individual interfaces in Ni/Si system during low temperature reactions.
Microelectron. Eng. 134 14-21, 2015.

Molnár, G., Katona, G., Langer, G., Csik, A., Chen, Y., Beke, D.: Low temperature homogenization in nanocrystalline PdCu thin film system.
Mater. Res. Express. 2 (10), 105012-105020, 2015.

Shenouda, S., Katona, G., Langer, G., Daróczi, L., Beke, D.: Nanoscale Kirkendall porosity formation during grain boundary intermixing in Au/Ag thin film system.
Mater. Lett. 145 67-69, 2015.

Oleshkevych, A., Voloshko, S., Sidorenko, S., Langer, G., Beke, D., Rennie, A.: Enhanced diffusion caused by surface reactions in thin films of Sn-Cu-Mn.
Thin Solid Films. 550 723-731, 2014.

Tynkova, A., Katona, G., Langer, G., Sidorenko, S., Voloshko, S., Beke, D.: Formation of CuxAu1-x phases by cold homogenization of Au/Cu nanocrystalline thin films.
Beilstein J. Nanotechnol. 5 1491-1500, 2014.

Langer, G., Erdélyi, G., Csik, A., Tskhakaya, D., Coster, D., Tőkési, K.: Interaction of low energy carbon ions with tungsten surface.
J. Phys. Conf. Ser. 488 (13), 1, 2014.

Ibrahim, M., Balogh, Z., Stender, P., Schelesiger, R., Greiwe, G., Schmitz, G., Parditka, B., Langer, G., Csik, A., Erdélyi, Z.: On the influence of the stacking sequence in the nucleation of Cu3Si: Experiment and the testing of nucleation models.
Acta Mater. 76 306-313, 2014.

Shenouda, S., Langer, G., Katona, G., Daróczi, L., Csik, A., Beke, D.: Production of NiSi phase by grain boundary diffusion induced solid state reaction between Ni2Si and Si(100) substrate.
Appl. Surf. Sci. 320 627-633, 2014.

Molnár, G., Erdélyi, G., Langer, G., Csik, A., Katona, G., Daróczi, L., Kis-Varga, M., Dudás, A., Beke, D.: Diffusion in Pd-Cu thin films.
Acta phys. Debr. 47 109-120, 2013.

Molnár, G., Erdélyi, G., Langer, G., Beke, D., Csik, A., Katona, G., Daróczi, L., Kis-Varga, M., Dudás, A.: Evolution of concentration profiles in Pd-Cu systems studied by SNMS technique.
Vacuum. 98 70-74, 2013.

Shenouda, S., Langer, G., Csik, A., Katona, G., Beke, D.: Investigation of solid state reactions between Ni2Si nanocrystalline film and Si Substrate.
Acta Phys. Debr. 47 (175), 175-184, 2013.

Beke, D., Langer, G., Molnár, G., Erdélyi, G., Katona, G., Lakatos, Á., Vad, K.: Kinetic pathways of diffusion and solid-state reactions in nanostructured thin films.
Philos. Mag. 93 (16), 1960-1970, 2013.

Parditka, B., Verezhak, M., Balogh, Z., Csik, A., Langer, G., Beke, D., Ibrahim, M., Schmitz, G., Erdélyi, Z.: Phase growth in an amorphous Si-Cu system, as shown by a combination of SNMS, XPS, XRD and APT techniques.
Acta Mater. 61 (19), 7173-7179, 2013.

Iguchi, Y., Erdélyi, Z., Langer, G., Magome, E., Sumitani, K., Csik, A., Beke, D., Mashimo, T.: Tailoring of interfaces in amorphous silicon-germanium multilayers on the atomic scale by ultra-high gravity.
Philos. Mag. Lett. 93 (12), 697-702, 2013.

Lovics, R., Csik, A., Takáts, V., Hakl, J., Vad, K., Langer, G.: Depth profile analysis of solar cells by Secondary Neutral Mass Spectrometry using conducting mesh.
Vacuum. 86 (6), 721-723, 2012.

Lakatos, Á., Erdélyi, G., Makovec, A., Langer, G., Csik, A., Vad, K., Beke, D.: Investigation of diffusional intermixing in Si/Co/Ta system by Secondary Neutral Mass Spectrometry.
Vacuum. 86 (6), 724-728, 2012.

Somogyvári, Z., Langer, G., Erdélyi, G., Balázs, L.: Sputtering yields for low-energy Ar+- and Ne+-ion bombardment.
Vacuum. 86 (12), 1979-1982, 2012.

Lovics, R., Csik, A., Takáts, V., Langer, G., Vad, K.: Study of Atomic Migration in Zinc Oxide Layers by Depth Profile Analysis.
In: 27th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC, München, 2530-2531, 2012. ISBN: 3936338280

Lovics, R., Takáts, V., Csik, A., Hakl, J., Langer, G., Baji, Z., Lábadi, Z., Vad, K.: Surface roughness and interface study by Secondary Neutral Mass Spectrometry.
14th Joint Vacuum Conference, 12th Europena Vacuum Conference, 11th Annual Meeting of the German Vacuum Society, 19th Croatian-Slovenian Vacuum Meeting. Dubrovnik, Croatia, 4-8 June, 2012 : abstract book 211, 2012.

Benoudia, M., Gao, F., Roussel, J., Labat, S., Gailhanou, M., Thomas, O., Beke, D., Erdélyi, Z., Langer, G., Csik, A., Kis-Varga, M.: Thermoelasticity and interdiffusion in CuNi multilayers.
Phys. Rev. B. 85 (23), 235404- 235404-7, 2012.

Beke, D., Lakatos, Á., Erdélyi, G., Makovec, A., Langer, G., Daróczi, L., Vad, K., Csik, A.: Investigation of grain boundary diffusion in thin films by SNMS technique.
Defect Diffus. Forum. 312-315 1208-1215, 2011.

Lovics, R., Csik, A., Takáts, V., Vad, K., Langer, G.: Átlátszó vezető oxidrétegek tulajdonságainak vizsgálata.
In: "Új fények a fizikában" : Fizikus vándorgyűlés Pécs, 2010. augusztus 24-27.. Szerk.: Ádám Péter Mechler Mátyás Illés, Eötvös Loránd Fizikai Társulat, Budapest, 45, 2010.

Lovics, R., Takáts, V., Csik, A., Langer, G., Vad, K.: Depth Profile Analysis of Amorphous/Microcrystalline Si Solar Cells by Secondary Neutral Mass Spectroscopy.
In: 5th World Conference on Photovoltaic Energy Conversion, 6-10 September 2010, Valencia, Spain, WIP-Renewable Energies, Munich, 3152-3153, 2010. ISBN: 3936338264

Lovics, R., Takáts, V., Csik, A., Langer, G., Vad, K.: Depth Profile Analysis of Amorphous/Microcrystalline Si Solar Cells by Secondary Neutral Mass Spectroscopy.
25th European Photovoltaic Solar Energy Conference and Exhibition, 5th World Conference on Photovoltaic Energy Conversion, Valencia, Spain : annual report 25, 2010.

Erdélyi, Z., Beke, D., Langer, G., Csik, A., Cserháti, C., Balogh, Z.: Interface kinetics and morphology on the nanoscale.
Vacuum. 84 (1), 26-31, 2010.

Raïssi, M., Vizzini, S., Langer, G., Rochdi, N., Oughaddou, H., Coudreau, C., Nitsche, S., D'Avitaya,, F., Aufray, B., Lazzari, J.: Interfacial solid phase reactions in cobalt/aluminum oxide/silicon(001) system.
Thin Solid Films. 518 (21), 5992-5994, 2010.

Lakatos, Á., Erdélyi, G., Langer, G., Daróczi, L., Vad, K., Csik, A., Dudás, A., Beke, D.: Investigation of diffusional intermixing in Si/Co/Ta system by Secondary Neutral Mass Spectrometry.
In: 13th Joint Vacuum Conference Book of Abstracts /ed. Andrej Vincze, [S.n.], Poprad, 158-158, 2010. ISBN: 9788073999698

Csik, A., Serényi, M., Erdélyi, Z., Nemcsics, A., Cserháti, C., Langer, G., Beke, D., Frigeri, C., Simon, A.: Investigation of thermal stability of hydrogenated amorphous Si/Ge multilayers.
Vacuum. 84 (1), 137-140, 2010.

Lakatos, Á., Erdélyi, G., Langer, G., Daróczi, L., Vad, K., Csik, A., Dudás, A., Beke, D.: Investigations of diffusion kinetics in Si/Ta/Cu/W and Si/Co/Ta systems by secondary neutral mass spectrometry.
Vacuum. 84 (7), 953-957, 2010.

Lakatos, Á., Erdélyi, G., Langer, G., Daróczi, L., Vad, K., Csik, A., Dudás, A., Beke, D.: Investigations of diffusion kinetics in Si/Ta/Cu/W and Si/Co/Ta systems by secondary neutral mass spectrometry.
Vacuum. 85 (4), 493-497, 2010.

Lakatos, Á., Langer, G., Csik, A., Cserháti, C., Kis-Varga, M., Daróczi, L., Katona, G., Erdélyi, Z., Erdélyi, G., Vad, K., Beke, D.: Nanoscale investigation of shift of individual interfaces in temperature induced processes of Ni-Si by secondary neutral mass.
Appl. Phys. Lett. 97 233103-1 - 233103-3, 2010.

Lovics, R., Csik, A., Takáts, V., Vad, K., Langer, G.: SNMS depth profile analysis of solar cells using conducting mesh.
13th Joint Vacuum Conference June 20-24, 2010, Štrbské Pleso 15, 2010.

Csik, A., Vad, K., Langer, G., Katona, G., Tóth-Kádár, E., Péter, L.: Analysis of Co/Cu multilayers by SNMS reverse depth profiling.
Vacuum. 84 (1), 141-143, 2009.

Cserháti, C., Erdélyi, Z., Katona, G., Csik, A., Lakatos, Á., Langer, G., Kis-Varga, M., Daróczi, L., Erdélyi, G., Vad, K., Zizak, I., Dudzik, E., Feyerherm, R., Beke, D.: Anomalous growth kinetics of the Ni2Si reaction layer in a-Si/Ni system.
In: International Workshop "Diffusion and Solid State Reactions on Nanoscale". Ed.: Csik Attila, University of Debrecen, Department of Solid State Physics, Debrecen, 23, 2009.

Vad, K., Hakl, J., Csik, A., Mészáros, S., Kis-Varga, M., Langer, G., Pallinger, Á., Bódog, M.: Application of secondary neutral mass spectrometry in the investigation of doped perovskites.
Vacuum. 84 (1), 144-146, 2009.

Cserháti, C., Erdélyi, Z., Balogh, Z., Daróczi, L., Csik, A., Langer, G., Varga, M., Zizak, I., Erko, A., Beke, D.: Characterization of intermetallic layer with nanoresolution using X-ray standing wave technique.
Defect Diffus. Forum. 289-292 369-376, 2009.

Lakatos, Á., Csik, A., Langer, G., Erdélyi, G., Katona, G., Daróczi, L., Vad, K., Tóth, J., Beke, D.: Investigation of failure mechanisms at Ta and TaO diffusion barries by secondary neutral mass spectrometry.
Vacuum. 84 (1), 130-133, 2009.

Erdélyi, Z., Cserháti, C., Csik, A., Daróczi, L., Langer, G., Balogh, Z., Varga, M., Beke, D., Zizak, I., Erko, A.: Nanoresolution interface studies in thin films by synchotron x-ray diffraction and by using x-ray waveguide structure.
X-ray spectrom.. 38 (4), 338-342, 2009.

Vad, K., Csik, A., Langer, G.: Secondary neutral mass spectrometry - a powerful technique for quantitative elemental and depth profiling analyses of nanostructures.
Spectroscopy Europe 21 (4), 13-16, 2009.

Lakatos, Á., Erdélyi, G., Langer, G., Daróczi, L., Vad, K., Csik, A., Beke, D.: Secondary Neutral Mass Spectrometry investigations of diffusion effects in Si/Ta/Cu/W and Si/Co/Ta systems.
In: Book of abstracts of 4-th Symposium on Vacuum based Science and Technology in conjunction with 8-th Annual Meeting of German Vacuum Society. Konferencia helye, ideje: Gdansk, Lengyelország, 2009.09.20-2009.09.23.. Ed.: Witold Gulbinski, Lenygelország, Kolobrzeg, 44, 2009.

Cserháti, C., Glodán, G., Csik, A., Langer, G., Erdélyi, Z., Balogh, Z., Beke, D.: Co Anomalous Growth Kinetics of the CoSi Reaction Layer in a Si/System.
Defect Diffus. Forum. 273-276 99-104, 2008.

Kis-Varga, M., Langer, G., Csik, A., Erdélyi, Z., Beke, D.: Effect of substrate temperature on the different diffuseness of subsequent interfaces in binary multilayers.
Defect Diffus Forum. 277 27-31, 2008.

Csik, A., Langer, G., Erdélyi, G., Beke, D., Erdélyi, Z., Vad, K.: Investigation of Sb diffusion in amorphous silicon.
Vacuum. 82 (2), 257-260, 2008.

Lakatos, Á., Csik, A., Langer, G., Erdélyi, G., Katona, G., Daróczi, L., Vad, K., Tóth, J., Beke, D.: Investigations of failure mechanisms at Ta and TaO diffusion barriers by SNMS.
Atomki Annual Report. 16 (1), 50, 2008.

Cserháti, C., Balogh, Z., Csik, A., Langer, G., Erdélyi, Z., Glodán, G., Katona, G., Beke, D., Zizak, I., Darowska, N., Dudzik, E., Feyerherm, R.: Linear growth kinetics of Nanometric silicides in Co/amorphous-Si and Co/CoSi/amorphous-Si thin films.
J. Appl. Phys. 104 (2), 024311-1-6, 2008.

Balogh, Z., Cserháti, C., Erdélyi, Z., Csik, A., Langer, G., Zizak, I., Darowski, N., Dudzik, E., Feyerherm, R., Beke, D.: Silicide formation reactions in a-Si/Co multilayered samples.
Defect Diffus. Forum. 277 3-8, 2008.

Balogh, Z., Erdélyi, Z., Beke, D., Langer, G., Csik, A., Boyen, H., Wiedwald, U., Ziemann, P., Portavoce, A., Geirardeaux, C.: Transition from anomalous kinetics toward Fickian diffusion for Si dissolution in to amorphous Ge.
Appl. Phys. Lett. 92 (14), 143104, 2008.

Péter, L., Katona, G., Berényi, Z., Vad, K., Langer, G., Tóth-Kádár, E., Pádár, J., Pogány, L., Bakonyi, I.: Electrodeposition of Ni-Co-Cu/Cu multilayers 2.: Calculations of the element distribution and experimental depth profile analysis.
Electrochim. Acta. 53 837-845, 2007.

Erdélyi, Z., Langer, G., Beke, D., Csik, A.: Interface shape change and shift kinetics on the nanoscale.
Solid State Phenom. 129 105-110, 2007.

Benoudia, M., Roussel, M., Labat, S., Thomas, O., Kis-Varga, M., Beke, D., Langer, G.: Investigating interdiffusion in Mo/V multilayers from x-ray scattering and kinetic simulations.
Diffus. Def. Data. 264 13-18, 2007.

Erdélyi, Z., Langer, G., Csik, A., Beke, D.: Nanoscale effects in interdiffusion.
Defect Diffus. Forum. 264 91-98, 2007.

Langer, G., Erdélyi, Z., Cserháti, C., Kis-Varga, M., Beke, D.: Solid state reactions and diffusion on nanoscale in multilayers.
Acta phys. Debr. 41 111-111, 2007.

Beke, D., Erdélyi, Z., Langer, G., Csik, A., Katona, G.: Diffusion on the nanometer scale.
Vacuum. 1-3 (80), 87-91, 2005.

Beke, D., Erdélyi, Z., Szabó, I., Langer, G., Katona, G., Cserháti, C.: Non-linear effects in diffusion on nanoscale.
Defect. Diffus. Forum. 237-240 1031-1042, 2005.

Csik, A., Erdélyi, G., Langer, G., Daróczi, L., Beke, D., Nyéki, J., Erdélyi, Z.: Pattern formation in SiSb system.
Vacuum. 80 (1-3), 168-173, 2005.

Nyéki, J., Girardeaux, C., Erdélyi, Z., Csik, A., Daróczi, L., Langer, G., Beke, D., Rolland, A., Bernardini, J., Erdélyi, G.: Sb diffusion and segregation in amorphous Si thin films.
Defect. Diffus. Forum. 237-240 1246-1251, 2005.

Erdélyi, Z., Langer, G., Beke, D.: Transient interface sharpening in miscible alloys.
In: Proceedings of the 1st International Conference on Diffusion in Solids and Liquids DSL-2005 / Ochsner, A., Gracio, J., Barlat, F, Wiley - VCH, Weinheim, 215-218, 2005.

Beke, D., Erdélyi, Z., Szabó, I., Langer, G., Katona, G., Cserháti, C.: Diffusion on the Nanoscale.
Arch. Metall. Mater. 49 (2), 219-235, 2004.

Erdélyi, G., Langer, G., Nyéki, J., Kövér, L., Tomastik, C., Werner, W., Csik, A., Stoeri, H., Beke, D.: Investigation of TA frain boundary diffusion in copper by means of Auger electron spectroscopy.
Thin Solids Films. 459 303-307, 2004.

Erdélyi, Z., Sladecek, M., Stadler, L., Zizak, I., Langer, G., Kis-Varga, M., Beke, D., Sepiol, B.: Transient Interface Sharpening in Miscible Alloys.
Science. 306 (1), 1913-1915, 2004.

Kapta, K., Csik, A., Daróczi, L., Papp, Z., Beke, D., Langer, G., Greer, L., Barber, Z., Kis-Varga, M.: Degradation of Ag/Si multilayers during heat treatments.
Vacuum. 72 (1), 85-89, 2003.

Beke, D., Szabó, I., Langer, G., Erdélyi, Z., Cserháti, C., Daróczi, L.: Diffúzió nanoskálán.
Magyar Tud. 48 (9), 1130-1137, 2003.

Papp, Z., Csik, A., Erdélyi, G., Langer, G., Beke, D., Daróczi, L., Simon, A., Kapta, K.: Effect of hydrostatic pressure on crystallization and decomposition in amorphous Si/SiSb/Si system.
Vacuum. 71 (1-2), 273-277, 2003.

Papp, Z., Beke, D., Katona, G., Langer, G.: Effects of Gradient Energy and Stress Terms in Diffusional Intermixing of Multilayers.
Defect Diffus. Forum. 216-217 1-12, 2003.

Malyovanik, M., Iván, I., Csik, A., Langer, G., Beke, D., Kökényesi, M.: Laser-induced optical changes in amorphous multilayers.
J. Appl. Phys. 93 (1), 139-142, 2003.

Beke, D., Erdélyi, Z., Szabó, I., Cserháti, C., Papp, Z., Kapta, K., Katona, G., Langer, G., Kis-Varga, M.: Nanoscale effects in diffusion.
Adv. in Sci. and Tech. 30-33 111, 2003.

Beke, D., Csik, A., Kökényesi, S., Langer, G., Szabó, I.: Stimulated structural transformations in amorphous semiconductor multilayers.
Phys. Status Solidi C Conf. Crit. Rev. 1 (3), 970-974, 2003.

Beke, D., Erdélyi, Z., Papp, Z., Kapta, K., Katona, G., Langer, G., Kis-Varga, M., Cserháti, C., Szabó, I.: Diffusion on nanoscale.
In: Proceedings of the 8th Seminar Diffusion and thermodynamics of materials, Brno, 2002, Masaryk University, Brno, 52-59, 2002.

Nyéki, J., Girardeaux, C., Erdélyi, Z., Langer, G., Erdélyi, G., Beke, D., Rolland, A., Beke, D., Erdélyi, Z., Erdélyi, G.: AES study of surface segregation of Ge in amorphous Si1-xGex thin film alloys.
Surf. Sci. 495 (3), 195-203, 2001.

Erdélyi, Z., Girardeaux, C., Langer, G., Beke, D., Rolland, A., Bernardini, J.: Determination of grain-boundary diffusion of Ag in nanocrystalline Cu by the Hwang-Balluffi method.
J. Appl. Phys. 89 (7), 3971-3975, 2001.

Kövér, L., Tougaard, S., Tóth, J., Daróczi, L., Szabó, I., Langer, G., Menyhárd, M.: Determination of overlayer thickness by QUASES analysis of photon-excited KLL Auger spectra of Ni and Cu films.
Surf. Interface Anal. 31 (4), 271-279, 2001.

Beke, D., Langer, G., Csik, A., Erdélyi, Z., Kis-Varga, M., Szabó, I., Papp, Z.: Diffusion and thermal stability in multilayers.
Defect Diffus. Forum. 194-199 1403-1416, 2001.

Csik, A., Langer, G., Beke, D., Erdélyi, Z., Menyhárd, M., Sulyok, A.: Interdiffusion in amorphous Si/Ge multilayers by Auger depth profiling technique.
J. Appl. Phys. 89 (1), 804-806, 2001.

Vallasek, I., Erdélyi, G., Langer, G., Gődény, I., Beke, D.: Ni short circuit diffusion in alumina.
Defect Diffus. Forum. 194-199 1033-1038, 2001.

Csik, A., Beke, D., Langer, G., Erdélyi, Z., Daróczi, L., Kapta, K., Kis-Varga, M.: Non-linearity due to the strong concentration dependence of diffusion in amorphous Si-Ge multilayers.
Vacuum. 61 (2-4), 297-301, 2001.

Csik, A., Malyovanik, M., Dorogovics, J., Kökényesi, S., Beke, D., Szabó, I., Langer, G.: Photo-stimulated structural transformations and optical recording in amorphous semiconductor multilayer.
J. Optoelectron. Adv. Mater. 3 (1), 33-36, 2001.

Erdélyi, Z., Girardeaux, C., Langer, G., Daróczi, L., Rolland, A., Beke, D.: Determination of grain-boundary diffusion coefficients by Auger electron spectroscopy.
Appl. Surf. Sci. 162-163 213-218, 2000.

Simon, A., Csik, A., Pászti, F., Kiss, Á., Beke, D., Daróczi, L., Erdélyi, Z., Langer, G.: Study of interdiffusion in amorphous Si/Ge multilayers by Rutherford backscattering spectrometry.
Nucl. Instrum. Methods. Phys. Res. B. 161-163 471-475, 2000.

Kis-Varga, M., Dudás, A., Langer, G., Beke, D., Kerekes, G., Daróczi, L.: XRD study of thermal stability of mo/V crystalline multilayers.
Mater. Sci. Forum. 321-324 463-468, 2000.

Erdélyi, Z., Beke, D., Langer, G.: On the range of validity of the continuum approach for non-linear diffusional mixing of multilayers.
Phil. Mag. A. 79 (8), 1757-1768, 1999.

Beke, D., Dudás, A., Csik, A., Langer, G., Kis-Varga, M., Daróczi, L., Erdélyi, Z.: On the thermal stability of multilayers.
Funct. Mater. 6 (3), 539-544, 1999.

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